The concentration of silicon is evident and the composite with

The concentration of silicon is evident and the composite with

50 wt% Si clearly shows the presence of a large amount of highly crystalline particles. The silicon is obtained from wafers that are milled to sub-micrometric and nanometric sizes to improve their surface area and hence efficiency to collect lithium. Figure 2 SEM of the investigated anodes embedded in the polymer or binder (PVDF). (a) pure CNS and (b,c) composites containing (b) 20 wt% Si and (c) 50 wt% Si. The milled soot shows the 2D band in Raman at approximately 2,700/cm. This Palbociclib concentration feature is typical of graphene or graphitic carbon selleck screening library that is the single most important constituent in our CNS due to its positive improvements in mechanical characteristics (Figure  2). Our interest in those structures is due to their outstanding mechanical properties, in particular, their elastic behavior [31–33]. The particles are formed in times of 10 h or less in a high-energy mill (SPEX).The Raman characterization presented in Figure  3 shows the presence of both

constituents in the composite. Silicon can be identified in the 1 wt% Si sample with a relatively small reflection at approximately 521 nm. This reflection intensity increases with Si content; however, this is clear if we considered that the Raman results presented in a normalized scale. Further, the intensity of Si increases proportionally to the Si content that is more evident when the results are analyzed in normalized intensity. We use a × 1,000 magnification in Raman to be able to analyze the material in a discrete PI3K inhibitor fashion with the potential to discern Si and the

thin layer of carbon along the Si particles.The results presented in Figure  4 show Raman mapping of the carbon nanostructures and silicon composites. In Figure  4a, the presence of both constituents Si and carbon nanostructures is observed. Due to the higher crystallinity of Si, the Raman spectrum is mainly dominated by the first order band of Si at approximately 521 nm. Nonetheless, the presence of carbon is also discernible DNA ligase in the spectrum. In Figure  4b, pure carbon is observed as no silicon is expected. In both cases, the spectrum shows the D, G, and 2D bands for carbon. The D band is also known as defect band that in this case is by the large amount of defects or dangling bonds implying that our carbon is nanostructured; on the other hand, the 2D band is of major importance in this work because this band is the evidence for the presence of graphene and/or graphitic carbon. The presence of this type of carbon nanostructures is responsible for the outstanding elastic behavior of the composite. The mapping demonstrates that our composites are homogeneous and is observed in Figure  4 by the good dispersion of the constituents on the maps.

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